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首页> 外文期刊>Journal of Computational Electronics >Developing a full 3D NEGF simulator with random dopant and interface roughness
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Developing a full 3D NEGF simulator with random dopant and interface roughness

机译:开发具有随机掺杂剂和界面粗糙度的完整3D NEGF仿真器

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We have developed a full 3D Non Equilibrium Green's Function quantum transport simulator of nanoelectronic devices. In order to illustrate the capabilities of the simulator we have computed the transmission function for silicon nanowires, in the presence of surface roughness and unintentional dopant atoms. Unlike the case of 2D simulations, in which the channel is blocked by the presence of only one impurity, the 3D current flow can turn in 3D avoiding the local impurity potential. This feature counts for a milder effect of the stray impurities and trapped carriers on the current in nanoscaled devices. Another interesting effect is the interference between the reflections of the electron wave function, from multiple impurities in the channel, which produces visible features in the transmission function. The electron density is deformed by the impurity in the channel, which is an effect of the deformation of the transversal electron wave function around the local impurity potential. Similar phenomenon occurs in the case of surface roughness. The above results illustrate the acute need for a three-dimension description of the transport in nano devices in the presence of atomic scale variations in doping and interface configuration.
机译:我们已经开发了纳米电子设备的完整3D非平衡格林函数量子传输模拟器。为了说明模拟器的功能,我们在存在表面粗糙度和意外掺杂原子的情况下,计算了硅纳米线的传输函数。与2D模拟的情况不同,在2D模拟中,只有一种杂质的存在会阻塞通道,而3D电流可以转向3D,从而避免了局部杂质电位。此功能可以算出杂散杂质和捕获的载流子对纳米级器件中电流的温和影响。另一个有趣的效果是电子波函数的反射受到通道中多个杂质的干扰,从而在传输函数中产生可见特征。电子密度由于沟道中的杂质而变形,这是围绕局部杂质电势的横向电子波函数变形的影响。在表面粗糙度的情况下也会发生类似的现象。以上结果说明了在掺杂和界面构型存在原子尺度变化的情况下,急需对纳米器件中的迁移进行三维描述。

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