Maximal Defect-Free Component in Nanoscale Crossbar Circuits Amidst Stuck-Open and Stuck-Closed Faults

摘要

We propose a technique for the analysis of manufacturing yield of nano-crossbar for the different values of defect percentage and crossbar-size. We provide an estimate of the minimum-size crossbar to be fabricated, wherein a defect-free crossbar of a given size can always be found with a guaranteed yield. Our technique is based on logical merging of two defective rows (or two columns) that emulate a defect-free row (or column). The proposed technique easily handles both the stuck-open and stuck-closed faults. Experimental results show that the proposed method provides higher defect-tolerance compared to that of previous techniques.