STUCK-OPEN FAULT DETECTING CIRCUIT OF LOGIC CIRCUIT

摘要

The present invention relates to a stuck open fault detection circuit for accurately and quickly performing stuck open fault detection of a combination logic circuit composed of a plurality of internal logic circuits. To this end, the present invention is provided in one internal logic circuit. A first logic circuit configured to perform stuck open fault detection in the state of activating the P logic block and the N logic block and generating two outputs having a logic level corresponding to the detection resu In response to the output from the first logic circuit, when there is no stuck open fault detection in one internal logic circuit, the other internal logic circuit is kept in the same state as the one internal logic circuit, and one internal logic circuit Output signal combination means for maintaining a test output in another internal logic circuit in a failure detection state when there is a stuck open failure detection in the control circuit; And when there is a fault detection in one internal logic circuit, the output is kept in a fault detection state based on the switching control from the corresponding output signal combination means, and when there is no fault detection in one internal logic circuit, And a second logic circuit for performing stuck open fault detection in a state in which P logic blocks and N logic blocks included in the internal logic circuits are activated, and generating two outputs having a logic level corresponding to the detection result.