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首页> 外文期刊>Journal of Applied Physics >Metal-insulator transition induced by postdeposition annealing in low doped manganite films
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Metal-insulator transition induced by postdeposition annealing in low doped manganite films

机译:后掺杂退火在低掺杂锰薄膜中诱导的金属-绝缘体转变

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摘要

We studied the transport and magnetic properties of low-doped manganite films after different oxygenation processes. The oxygen content was adjusted by postdeposition annealing at different oxygen pressures and annealing times. For all the samples we observed an increase in the Curie temperature and the remnant magnetization with the oxygen content. In general, for decreasing number of oxygen vacancies, samples under expansive strain become more homogeneous and their electrical resistivity decreases. A metal-insulator transition is induced in highly oxygenated films grown on SrTiO3, probably related to a shift of the mobility edge crossing below the Fermi energy. We found that the oxygenation dynamics depend critically on the strain field induced by the substrates and also on the Sr doping concentration. © 2009 American Institute of Physics Article Outline INTRODUCTION EXPERIMENTAL DETAILS RESULTS AND DISCUSSION CONCLUSIONS
机译:我们研究了不同氧合过程后低掺杂锰矿薄膜的传输和磁性。通过在不同的氧气压力和退火时间下进行后退火来调节氧气含量。对于所有样品,我们观察到居里温度的升高以及剩余氧含量随氧含量的增加而增加。通常,随着氧空位数量的减少,膨胀应变下的样品变得更加均匀,其电阻率降低。在SrTiO3 上生长的高度氧化的薄膜中诱导了金属-绝缘体的转变,这可能与迁移率边缘的越过费米能量的移动有关。我们发现,氧合动力学关键取决于基片引起的应变场以及Sr掺杂浓度。 ©2009美国物理研究所文章大纲引言实验细节结果和讨论结论

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