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Thickness-Induced Metal-Insulator Transition in Sb-doped SnO2 Ultrathin Films: The Role of Quantum Confinement

机译:掺Sb的SnO2超薄膜中厚度诱导的金属-绝缘体跃迁:量子约束的作用

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摘要

A thickness induced metal-insulator transition (MIT) was firstly observed in Sb-doped SnO2 (SnO2:Sb) epitaxial ultrathin films deposited on sapphire substrates by pulsed laser deposition. Both electrical and spectroscopic studies provide clear evidence of a critical thickness for the metallic conductivity in SnO2:Sb thin films and the oxidation state transition of the impurity element Sb. With the shrinkage of film thickness, the broadening of the energy band gap as well as the enhancement of the impurity activation energy was studied and attributed to the quantum confinement effect. Based on the scenario of impurity level pinning and band gap broadening in quantum confined nanostructures, we proposed a generalized energy diagram to understand the thickness induced MIT in the SnO2:Sb system.
机译:首先通过脉冲激光沉积在蓝宝石衬底上沉积的掺Sb的SnO2(SnO2:Sb)外延超薄膜中观察到厚度诱导的金属-绝缘体转变(MIT)。电学和光谱学研究都清楚地证明了SnO2:Sb薄膜中金属电导率的临界厚度以及杂质元素Sb的氧化态转变。随着薄膜厚度的减小,能带隙的扩大以及杂质活化能的增加被研究,这归因于量子限制效应。基于量子受限纳米结构中杂质能级固定和带隙展宽的情况,我们提出了一个广义能图,以了解SnO2:Sb系统中厚度诱导的MIT。

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