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首页> 外文期刊>Scientific reports. >Thickness-Induced Metal-Insulator Transition in Sb-doped SnO2 Ultrathin Films: The Role of Quantum Confinement
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Thickness-Induced Metal-Insulator Transition in Sb-doped SnO2 Ultrathin Films: The Role of Quantum Confinement

机译:厚度诱导的金属绝缘体在SB掺杂的SnO 2 超薄薄膜中转换:量子限制的作用

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A thickness induced metal-insulator transition (MIT) was firstly observed in Sb-doped SnO2 (SnO2:Sb) epitaxial ultrathin films deposited on sapphire substrates by pulsed laser deposition. Both electrical and spectroscopic studies provide clear evidence of a critical thickness for the metallic conductivity in SnO2:Sb thin films and the oxidation state transition of the impurity element Sb. With the shrinkage of film thickness, the broadening of the energy band gap as well as the enhancement of the impurity activation energy was studied and attributed to the quantum confinement effect. Based on the scenario of impurity level pinning and band gap broadening in quantum confined nanostructures, we proposed a generalized energy diagram to understand the thickness induced MIT in the SnO2:Sb system.
机译:首先在SB掺杂的SnO 2℃下观察到厚度诱导的金属 - 绝缘体转变(MIT)在Sapphire激光沉积上沉积在蓝宝石基板上的外延超薄膜中观察到沉积在蓝宝石基板上的外延超薄膜。电气和光谱研究都提供了清晰的证据证明了SnO 2 :Sb薄膜和杂质元素Sb的氧化态转变的金属导电致力的临界厚度。利用薄膜厚度的收缩,研究了能带隙的扩大以及杂质激活能量的增强,并归因于量子限制效果。基于量子狭窄纳米结构的杂质水平钉扎和带隙扩展的场景,我们提出了一种广义能量图,以了解SnO 2 :Sb系统中的厚度诱导的麻法。

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