...
首页> 外文期刊>Journal of Applied Physics >A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production
【24h】

A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production

机译:基于熵产生的电迁移,热迁移和应力迁移平均失效时间统一模型

获取原文
获取原文并翻译 | 示例

摘要

We have revisited Black's equation of mean-time-to-failure (MTTF) for electromigration from the viewpoint that in irreversible processes, entropy production is the controlling behavior. We justify that the power factor on current density is n = 2, as given in the original Black's equation. Furthermore, on the basis of entropy production, we provide a unified model of MTTF for thermomigration and stress-migration. We note that up to now, no MTTF for thermomigration and stress-migration is given. Published under license by AIP Publishing.
机译:从不可逆过程中,熵产生是控制行为的观点,我们重新审视了布莱克的电迁移平均失效时间方程(MTTF)。我们证明了电流密度的功率因数为n = 2,如原始布莱克方程式所给。此外,在熵产生的基础上,我们提供了用于热迁移和应力迁移的MTTF统一模型。我们注意到,到目前为止,还没有给出用于热迁移和应力迁移的MTTF。由AIP Publishing授权发布。

著录项

  • 来源
    《Journal of Applied Physics 》 |2019年第7期| 075109.1-075109.6| 共6页
  • 作者

    Tu K. N.; Gusak A. M.;

  • 作者单位

    Univ Calif Los Angeles Dept Mat Sci & Engn Los Angeles CA 90095 USA|Natl Chiao Tung Univ Int Coll Semicond Technol Hsinchu 30010 Taiwan;

    Cherkasy Natl Univ Dept Phys UA-18000 Cherkassy Ukraine;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号