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首页> 外文期刊>Journal of Applied Physics >Design of semiconductor surface pits for fabrication of regular arrays of quantum dots and nanorings
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Design of semiconductor surface pits for fabrication of regular arrays of quantum dots and nanorings

机译:用于制造量子点和纳米环规则阵列的半导体表面坑的设计

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摘要

We report a systematic computational study on the formation of complex nanostructures consisting of quantum dots and nanorings on surfaces of coherently strained thin films grown epitaxially on pit-patterned substrates. The analysis is based on self-consistent dynamical simulations according to a film surface evolution model that has been validated experimentally by comparison of its predictions with experimental observations on Ge films grown on Si pit-patterned substrates and is supported by linear stability theory that explains the film surface nanopattern formation as the outcome of a Stranski-Krastanow instability. Emphasis is placed on the design of conical pit patterns and the effects on the resulting film surface nanopattern of varying geometrical design parameters including film thickness, pit-pattern period, pit depth, pit opening diameter, and pit wall inclination. We demonstrate that varying the pit opening diameter and the pit wall slope leads to formation of complex nanostructures inside the pits of a regular pit pattern on the film surface, which include quantum dots, as well as single nanorings and multiple concentric nanorings that may or may not surround a central quantum dot inside each pit. Our simulation predictions demonstrate that the ordered nanostructure patterns forming on the film surface can be controlled precisely by tuning the geometrical parameters of the pits on the pit-patterned substrate. Our findings have important implications for designing optimal semiconductor surface patterns toward enabling future nanofabrication technologies. Published under license by AIP Publishing.
机译:我们报告了系统的计算研究,该研究形成了由凹坑图案化衬底上外延生长的相干应变薄膜表面上的量子点和纳米环组成的复杂纳米结构。该分析基于膜表面演化模型的自洽动力学仿真,该模型已通过将其预测结果与在硅凹坑图案化衬底上生长的Ge膜的实验观察结果进行比较而在实验上得到了验证,并受到线性稳定性理论的支持,该线性解释解释了膜表面纳米图案的形成是Stranski-Krastanow不稳定性的结果。重点放在圆锥形凹坑图案的设计上,以及对不同的几何设计参数(包括膜厚,凹坑图案周期,凹坑深度,凹坑开口直径和凹坑壁倾角)对所得膜表面纳米图案的影响。我们证明改变凹坑开口直径和凹坑壁的倾斜度会导致在薄膜表面上规则凹坑图案的凹坑内形成复杂的纳米结构,其中包括量子点以及单个纳米环和多个同心纳米环,它们可能或可能不围绕每个凹坑内的中心量子点。我们的模拟预测表明,通过调节凹坑图案化衬底上凹坑的几何参数,可以精确控制在薄膜表面上形成的有序纳米结构图案。我们的发现对设计最佳的半导体表面图案以支持未来的纳米制造技术具有重要意义。由AIP Publishing授权发布。

著录项

  • 来源
    《Journal of Applied Physics 》 |2019年第4期| 045303.1-045303.12| 共12页
  • 作者单位

    Univ Massachusetts, Dept Chem Engn, Amherst, MA 01003 USA;

    Univ Massachusetts, Dept Chem Engn, Amherst, MA 01003 USA;

    Univ Massachusetts, Dept Chem Engn, Amherst, MA 01003 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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