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Effect of indium and antimony doping on the transport properties of direct vapour transport (DVT) grown SnSe single crystals

机译:铟和锑掺杂对直接气相传输(DVT)生长的SnSe单晶传输特性的影响

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摘要

Pure SnSe, 5% In, 10% In, 5% Sb, and 10% Sb doped SnSe single crystals were grown by the direct vapour transport technique. The energy dispersive X-ray analysis study of the samples showed them to be near stoichiometric but slightly Sn deficient. The X-ray diffraction study of all the as-grown single crystal samples showed that they possess an orthorhombic structure and the lattice parameters are in good agreement with the reported parameters. The thermoelectric power (S), dc electrical conductivity (sigma), and thermal conductivity (kappa) variation with temperature from ambient to 573 K substantiated the semiconducting nature of all the five samples. The sign of "S"was positive for all five samples for all the temperature range stating the sample to be a p-type semiconductor. The power factor (S-2 sigma) and figure of merit (ZT) variation with temperature showed that pure SnSe possesses the highest value compared to doped samples. The obtained results are studied and discussed in detail. Published by AIP Publishing.
机译:通过直接气相传输技术生长了纯SnSe,5%In,10%In,5%Sb和10%Sb掺杂的SnSe单晶。样品的能量色散X射线分析研究表明,它们接近化学计量,但锡含量略有不足。所有生长的单晶样品的X射线衍射研究表明它们具有正交晶结构,晶格参数与报道的参数非常吻合。从环境温度到573 K的热电功率(S),直流电导率(sigma)和热导率(kappa)随温度的变化证实了所有五个样品的半导体性质。对于所有五个样品,在所有温度范围内,“ S”的符号均为正,表明该样品为p型半导体。功率因数(S-2 sigma)和品质因数(ZT)随温度的变化表明,纯SnSe与掺杂样品相比具有最高的值。对获得的结果进行了详细的研究和讨论。由AIP Publishing发布。

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  • 来源
    《Journal of Applied Physics》 |2018年第21期|215103.1-215103.8|共8页
  • 作者单位

    Sardar Patel Univ, PG Dept Phys, Vallabh Vidyanagar 388120, Gujarat, India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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