Near edge x-ray absorption fine structure study of aligned π-bonded carbon structures in nitrogenated ta-C films

摘要

Polarization dependent studies of near edge x-ray absorption fine structure (NEXAFS) show evidence for the presence of aligned π-bonded carbon structures and the formation of a nonplanar CN phase in tetrahedral amorphous nitrogenated carbon (ta-CN) films deposited at room temperature. Moreover, the analysis of NEXAFS data as a function of nitrogen concentration and annealing temperature leads to a comprehensive assignment of the local CN bonding configurations in these ta-CN films and suggests an unusual and almost thermally stable nitrogenated carbon structure.