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Electronic structure of double stacked InAs/GaAs quantum dots: Experiment and theory

机译:双堆叠InAs / GaAs量子点的电子结构:实验和理论

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摘要

An experimental and theoretical investigation on the electronic structure of double layer InAs/GaAs quantum dots (QDs) is presented. In order to evaluate the effects of the quantum coupling between the zero-dimensional states, the spacer separating the two QD layers is varied from 4.5 to 10 nm. The quantitative comparison between experiment and theory is obtained by a previously proposed single band effective masslike model, where the input parameter values are given by a systematic morphological, structural, and spectroscopic investigation of the QD samples. Although the two QDs forming the stacked pairs are not perfectly equal in size, the quantum coupling mechanism is predicted to occur when the spacer is thinner than 8 nm and to increase by reducing the spacer thickness. A good agreement between theory and experiment is found for the S, P, and D shell transitions both in single and double QD layers This result suggests that the model used can be a reliable guide for the design of devices based on double QDs.
机译:对双层InAs / GaAs量子点(QDs)的电子结构进行了实验和理论研究。为了评估零维状态之间的量子耦合效应,将两个QD层分开的间隔物从4.5到10 nm不等。实验和理论之间的定量比较是通过先前提出的单谱带有效质量样模型获得的,其中输入参数值是通过对QD样品进行系统的形态,结构和光谱研究得出的。尽管形成堆叠对的两个QD的尺寸并不完全相等,但预计当隔离物的厚度小于8 nm时会发生量子耦合机制,并且通过减小隔离物的厚度会增加量子耦合机制。对于单层和双层QD层中的S,P和D壳层转换,理论和实验之间都找到了很好的一致性。该结果表明,所使用的模型可以为基于双QD的设备设计提供可靠的指导。

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