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首页> 外文期刊>Japanese journal of applied physics >Steep switching less than 15mV dec~(-1) in silicon-on-insulator tunnel FETs by a trimmed-gate structure
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Steep switching less than 15mV dec~(-1) in silicon-on-insulator tunnel FETs by a trimmed-gate structure

机译:修整栅极结构可在绝缘体上硅隧道FET中实现小于15mV dec〜(-1)的陡峭开关

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摘要

We study a novel trimmed-gate (TG) structure, which substantially decreases the subthreshold swing (SS) of a tunnel field-effect transistor (TFET). Our technology computer-aided simulations demonstrate that the TG structure strongly suppresses the off leak component of the band-to-band tunneling current. As a result, an extremely steep SS of less than 15 mV dec(-1) can be realized in a silicon-on-insulator (SOI) TFET. We also demonstrate that the improvement of SS is enhanced by a high source doping thanks to the TG structure. The mechanism of the steep switching by the TG structure does not depend on any specific material or process technology. Therefore, the SS improvement as a result of the TG structure is applicable to various types of TFETs as well as the SOI TFET. (C) 2019 The Japan Society of Applied Physics
机译:我们研究了一种新型的修整栅(TG)结构,该结构大大降低了隧道场效应晶体管(TFET)的亚阈值摆幅(SS)。我们的技术的计算机辅助仿真表明,TG结构强烈地抑制了带间隧道电流的漏泄分量。结果,可以在绝缘体上硅(SOI)TFET中实现小于15 mV dec(-1)的非常陡的SS。我们还证明,由于TG结构,高源掺杂提高了SS的改善。 TG结构进行陡峭切换的机制不依赖于任何特定的材料或工艺技术。因此,由于TG结构而导致的SS改善适用于各种类型的TFET以及SOI TFET。 (C)2019日本应用物理学会

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  • 来源
    《Japanese journal of applied physics》 |2019年第sb期|SBBA16.1-SBBA16.5|共5页
  • 作者单位

    Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan;

    Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan;

    Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan;

    Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan;

    Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan;

    Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan;

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