首页> 外文期刊>Japanese Journal of Applied Physics. Part 2, Letters & Express Letters >Single-Electron Multiple-Valued Memory Using Ultra-Small Floating Gate Metal-Oxide-Semiconductor Field Effect Transistor
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Single-Electron Multiple-Valued Memory Using Ultra-Small Floating Gate Metal-Oxide-Semiconductor Field Effect Transistor

机译:使用超小型浮栅金属氧化物半导体场效应晶体管的单电子多值存储器

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摘要

This paper proposes a novel single-electron multiple-valued memory. It is a metal-oxide-semiconductor field effect transistor (MOS)-type memory with multiple separate control gates and floating gate layer, which consists of nano-crystal grains. The electron can tunnel among the grains (floating gates) and between the floating gate layer and the MOS channel. The memory can realize operations of 'write', 'store' and 'erase' of multiple-valued signals exceeding three values by controlling the single electron tunneling behavior. We use Monte Carlo method to simulate the operation of single-electron four-valued memory. The simulation results show that it can operate well at room temperature.
机译:本文提出了一种新颖的单电子多值存储器。它是一种金属氧化物半导体场效应晶体管(MOS)型存储器,具有多个单独的控制栅和浮栅层,由纳米晶粒组成。电子可以在晶粒(浮栅)之间以及浮栅层和MOS沟道之间隧穿。存储器可以通过控制单电子隧穿行为来实现对超过三个值的多值信号进行“写入”,“存储”和“擦除”操作。我们使用蒙特卡洛方法来模拟单电子四值存储器的操作。仿真结果表明它在室温下可以很好地工作。

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