首页> 外国专利> Hot electron injection metal-oxide-semiconductor transistor for use in memory cell of flash-type microelectromechanical memory in e.g. smart card, has floating gate comprising two parts that are connected by intermediate part

Hot electron injection metal-oxide-semiconductor transistor for use in memory cell of flash-type microelectromechanical memory in e.g. smart card, has floating gate comprising two parts that are connected by intermediate part

机译:用于例如在图1中的闪存型微机电存储器的存储单元中使用的热电子注入金属氧化物半导体晶体管。智能卡,具有浮动门,该浮动门包括通过中间部分连接的两个部分

摘要

The transistor (T4) has a semiconductor substrate (1) provided with source and drain areas (2, 3), and a floating gate (FG3) arranged between a control gate (CG3) and the substrate. The gate comprises two parts (p1, p2) arranged on sides of the source and drain areas at two distances (D1, D2) from the substrate, respectively. One of the distances is smaller than the other distance, where values of the distances range from 13 to 21 and from 8 to 10 nm, respectively. An intermediate part (p3) connects the parts. A dielectric layer (20) extends between the substrate and one of the parts. An independent claim is also included for a method for programming a metal-oxide-semiconductor (MOS) transistor.
机译:晶体管(T4)具有设置有源极和漏极区域(2、3)的半导体衬底(1)以及布置在控制栅极(CG3)和衬底之间的浮置栅极(FG3)。栅极包括两个部分(p1,p2),其分别布置在源极和漏极区域的侧面上,与衬底的距离为两个距离(D1,D2)。距离之一小于另一距离,其中距离的值分别在13到21 nm和8到10 nm的范围内。中间部分(p3)连接这些部分。介电层(20)在基板和部件之一之间延伸。还包括用于对金属氧化物半导体(MOS)晶体管进行编程的方法的独立权利要求。

著录项

  • 公开/公告号FR2973571A1

    专利类型

  • 公开/公告日2012-10-05

    原文格式PDF

  • 申请/专利权人 STMICROELECTRONICS (ROUSSET) SAS;

    申请/专利号FR20110052885

  • 发明设计人 LA ROSA FRANCESCO;

    申请日2011-04-04

  • 分类号H01L29/788;G11C16/02;

  • 国家 FR

  • 入库时间 2022-08-21 17:04:00

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