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Digital Alloys of AlN/AlGaN for Deep UV Light Emitting Diodes

机译:用于深紫外发光二极管的AlN / AlGaN数字合金

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摘要

We report a systematic study of the optical and electrical properties of deep ultraviolet light emitting diodes based on digital alloy structures of AlN/Al_(0.08)Ga_(0.92)N grown by gas source molecular beam epitaxy with ammonia. Digital alloys are formed by short period superlattices consisting of Al_(0.08)Ga_(0.92)N wells, 0.50 or 0.75 nm thick, and AlN barriers, 0.75 to 1.5 nm thick. For digital alloys with effective bandgap of 5.1 eV, average AlN composition 72%, we obtain room temperature electron concentrations up to 1 x 10~(19) cm~(-3) and resistivity of 0.005 Ω·cm and hole concentrations of 1 x 10~(18) cm~(-3) with resistivity of 6 Ω·cm. Light emitting diodes based on digital alloys are demonstrated operating in the range of 250 to 290 nm.
机译:我们报告了基于通过气源分子束外延生长的AlN / Al_(0.08)Ga_(0.92)N的数字合金结构对深紫外发光二极管的光学和电学特性的系统研究。数字合金由短周期的超晶格形成,该晶格由厚度为0.50或0.75 nm的Al_(0.08)Ga_(0.92)N阱和厚度为0.75至1.5 nm的AlN势垒组成。对于有效带隙为5.1 eV,平均AlN组成为72%的数字合金,我们获得的室温电子浓度最高为1 x 10〜(19)cm〜(-3),电阻率为0.005Ω·cm,空穴浓度为1 x 10〜(18)cm〜(-3),电阻率为6Ω·cm。事实证明,基于数字合金的发光二极管可在250至290 nm的范围内工作。

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