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首页> 外文期刊>Japanese journal of applied physics >Characterization of Zinc Oxide Films Grown by a Newly Developed Plasma Enhanced Metal Organic Chemical Vapor Deposition Employing Microwave Excited High Density Plasma
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Characterization of Zinc Oxide Films Grown by a Newly Developed Plasma Enhanced Metal Organic Chemical Vapor Deposition Employing Microwave Excited High Density Plasma

机译:利用微波激发高密度等离子体的新型等离子体增强金属有机化学气相沉积法生长的氧化锌膜的表征

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摘要

The radical reaction based semiconductor manufacturing has been applied to silicon device process. Such as SiO_2 and can be formed at low temperatures of under 500-600℃. In this study, we applied radical reaction based semiconductor manufacturing to compo
机译:基于自由基反应的半导体制造已应用于硅器件工艺。如SiO_2,可在低于500-600℃的低温下形成。在这项研究中,我们将基于自由基反应的半导体制造应用于组件

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