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High-Brightness 350 nm Ultraviolet InAIGaN Light Emitting Diodes on Si(111) Substrate with Transparent AlN/AlGaN Buffer Structure

机译:具有透明AlN / AlGaN缓冲结构的Si(111)衬底上的高亮度350 nm紫外InAIGaN发光二极管

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摘要

We report on high brightness ultraviolet (UV) light emitting diodes (LEDs) with an InAlGaN/AlGaN multi quantum well (MQW) on a Si(111) substrate emitting around 350 nm. With high indium contents up to 10% in the quaternary alloy InAlGaN well layers, strong UV emission is obtained in cathode-luminescence and photoluminescence measurements. With a novel AlN/AlGaN superlattices (SLs) buffer, a crack-free, low dislocation AIGaN cladding layer is expitaxially grown on a Si(111) substrate. By combining the quaternary InAlGaN well with a high indium content and the high quality AlGaN cladding layer on the AlN/AlGaN SLs, the InAlGaN/AlGaN MQW exhibits very high internal quantum efficiency of 15% at around 350 nm. The UV LED on Si(111) emits at a peak emission wavelength of 350.9 nm at 20 mA driving current. The maximum UV output power of the LED is 3.9 times as high as that without indium in the well.
机译:我们报告了高亮度紫外(UV)发光二极管(LED),其在发射约350 nm的Si(111)衬底上具有InAlGaN / AlGaN多量子阱(MQW)。由于四元合金InAlGaN阱层中的铟含量高达10%,因此在阴极发光和光致发光测量中可获得较强的紫外线发射。使用新型AlN / AlGaN超晶格(SLs)缓冲液,在Si(111)衬底上外延生长无裂纹,低位错的AIGaN包覆层。通过将具有高铟含量的四元InAlGaN阱和AlN / AlGaN SLs上的高质量AlGaN覆盖层结合在一起,InAlGaN / AlGaN MQW在350 nm左右具有非常高的内部量子效率,为15%。 Si(111)上的UV LED在20 mA驱动电流下的峰值发射波长为350.9 nm。 LED的最大紫外线输出功率是孔中没有铟的3.9倍。

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  • 来源
    《Japanese journal of applied physics》 |2010年第3issue1期|p.032101.1-032101.5|共5页
  • 作者单位

    Semiconductor Device Research Centers, Semiconductor Company, Panasonic Corporation, 1 Kotari-yakemachi, Nagaokakyo, Kyoto 617-8520, Japan;

    Semiconductor Device Research Centers, Semiconductor Company, Panasonic Corporation, 1 Kotari-yakemachi, Nagaokakyo, Kyoto 617-8520, Japan;

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