Device Quality Evaluation of Periodically Poled Crystals: by Diffraction Analysis at Different Wavelengths

摘要

A quality evaluation method of periodically poled crystals was suggested using two different wavelengths based on an analysis of far-field diffraction. To confirm the ability of our tool, diffraction intensities were obtained at various samples, and experimental results agreed well with simulation curve based on the binary phase grating theory. The proposed tool could easily distinguish that efficiency variation of second harmonic within an error of less than 2.54%. It could be a highly precise and convenient method to investigate periodically poled structures.