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A WIP-based exception-management model for integrated circuit back-end production processes

机译:用于集成电路后端生产过程的基于WIP的异常管理模型

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摘要

Meeting due dates for delivery of products is a key factor in achieving customer satisfaction in today’s globally competitive semiconductor market. However, undesirable production variations are inevitable in this industry, especially for ‘back-end’ factories that are closer to customers. This makes it difficult for management to maintain (or improve) a factory’s performance with respect to delivery on due dates. In practice, production managers ameliorate the adverse effects of manufacturing uncertainties by control of work in progress (WIP). The present study therefore proposes a WIP-exception management model to define, detect, and respond to WIP exceptions. First, a model for determining acceptable WIP deviation levels (AWDLs) is established to assist production managers in identifying WIP exceptions on monitored workstations. A correction mechanism is then proposed to adjust deviations in WIP levels (‘WIP exceptions’) in accordance with the projected AWDLs as soon as possible. A simulation model is constructed, and experiments are then conducted to evaluate the proposed model. The proposed model is confirmed as being able to set appropriate and effective WIP-exception conditions to trigger correction actions. The simulation experiment also demonstrates that the WIP-correction action can shorten the ‘back-to-normal’ duration, prolong the time between successive WIP exceptions, and improve average on-time delivery percentage. The study concludes that the proposed model does determine effective exception-triggering conditions, rectifies abnormal WIP levels promptly, and results in improved performance on due-date delivery for semiconductor ‘back-end’ factories.
机译:在当今全球竞争激烈的半导体市场中,按时交付产品是获得客户满意的关键因素。但是,在这个行业中不可避免地会出现不希望有的生产变化,尤其是对于距离客户更近的“后端”工厂。这使得管理人员难以维持(或提高)工厂在预定日期交货的绩效。实际上,生产经理通过控制在制品(WIP)来减轻制造不确定性的不利影响。因此,本研究提出了一种WIP异常管理模型来定义,检测和响应WIP异常。首先,建立用于确定可接受的WIP偏差水平(AWDL)的模型,以帮助生产经理识别受监视工作站上的WIP异常。然后提出一种校正机制,以根据预计的AWDL尽快调整WIP级别的偏差(“ WIP例外”)。构建了一个仿真模型,然后进行了实验以评估所提出的模型。所提出的模型被确认能够设置适当且有效的WIP例外条件以触发纠正措施。仿真实验还表明,WIP校正操作可以缩短“恢复正常”的持续时间,延长连续两次WIP异常之间的时间,并提高平均准时交付率。该研究得出的结论是,所提出的模型确实确定了有效的异常触发条件,可以迅速纠正异常WIP水平,并提高了半导体“后端”工厂的按时交货性能。

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