A Distributed Heterogeneous Inspection System for High Performance In- line Surface Defect Detection

摘要

This paper presents the Distributed Heterogeneous Inspection System (DHIS), which comprises two CUDA workstations and is equipped with CPU distributed computing, CPU concurrent computing, and GPU concurrent computing functions. Thirty-two grayscale images, each with 5,000x 12,288 pixels and simulated defect patterns, were created to evaluate the performances of three system configurations: (1) DHIS; (2) two CUDA workstations with CPU distributed computing and GPU concurrent computing; (3) one CUDA workstation with GPU concurrent computing. Experimental results indicated that: (1) only DHIS can satisfy the time limit, and the average turnaround time of DHIS is 37.65% of the time limit; (2) a good linear relationship exists between the processing speed ratio and the instruction sequence quantity ratio.