首页> 外文期刊>IEEE Transactions on Instrumentation and Measurement >High-temperature remote thermometry using laser-induced fluorescence decay lifetime measurements of Y/sub 2/O/sub 3/:Eu and YAG:Tb thermographic phosphors
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High-temperature remote thermometry using laser-induced fluorescence decay lifetime measurements of Y/sub 2/O/sub 3/:Eu and YAG:Tb thermographic phosphors

机译:使用激光诱导的Y / sub 2 / O / sub 3 /:Eu和YAG:Tb热成像荧光粉的荧光衰减寿命测量进行高温远程测温

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摘要

An Nd:YAG-laser-based remote sensing system for determining the surface temperature of substrates coated with thermographic phosphors has been developed. The fluorescence decay lifetime versus temperature measurements obtained for Y/sub 2/O/sub 3/:Eu (4.52% Ec) and YAG:Tb (5% Tb) over the temperature range 27 degrees C-1095 degrees C are presented. Both phosphors can be used for continuous temperature measurements over the range of approximately 550 degrees C-1000 degrees C. Stepwise regression analysis is used to calculate empirical relationships expressing temperature as a function of the measured fluorescence lifetimes for both phosphors beyond the onset temperature quenching point. The accuracy of the temperature measurements was estimated to be +or-5%. The intensities of the 611-nm Y/sub 2/O/sub 3/:Eu and the 544-nm YAG:Tb emission lines as a function of temperature are compared.
机译:已经开发出一种基于Nd:YAG激光的遥感系统,用于确定涂有热成像荧光粉的基材的表面温度。给出了在27摄氏度至1095摄氏度的温度范围内,Y / sub 2 / O / sub 3 /:Eu(4.52%Ec)和YAG:Tb(5%Tb)获得的荧光衰减寿命与温度的关系。两种荧光粉均可用于在大约550摄氏度至1000摄氏度范围内进行连续温度测量。逐步回归分析用于计算经验关系,将温度表示为两种荧光粉在超过起始温度猝灭点时所测得的荧光寿命的函数。 。温度测量的精度估计为+或-5%。比较了611 nm Y / sub 2 / O / sub 3 /:Eu和544 nm YAG:Tb发射线的强度随温度的变化。

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