首页> 外国专利> FLUORESCENCE LIFETIME MEASUREMENT DEVICE FOR ANALYZING MULTI-EXPONENTIAL DECAY FUNCTION TYPE EXPERIMENTAL DATA AT HIGH SPEED AND MEASUREMENT METHOD THEREFOR

FLUORESCENCE LIFETIME MEASUREMENT DEVICE FOR ANALYZING MULTI-EXPONENTIAL DECAY FUNCTION TYPE EXPERIMENTAL DATA AT HIGH SPEED AND MEASUREMENT METHOD THEREFOR

机译:高速分析多指数衰变函数型实验数据的荧光寿命测量装置及其测量方法

摘要

A fluorescence lifetime measuring apparatus according to an embodiment of the present invention includes: an irradiation light generator configured to generate irradiation light; a fluorescence photon detector configured to irradiate at least one or more samples, containing fluorescent molecules, with the irradiation light and collect a fluorescence photon generated by the irradiation; a converter configured to amplify the fluorescence photon and convert the amplified fluorescence photon into a fluorescence signal; and a measurer configured to analyze data of a function of the fluorescence signal by using a function obtained by multiplying a value, which is obtained by integrating the function of the fluorescence signal, by a simulation function.
机译:根据本发明实施例的荧光寿命测量设备包括:照射光发生器,被配置为产生照射光;以及荧光光子检测器,其被构造成用所述照射光照射至少一个或多个包含荧光分子的样品,并收集由所述照射产生的荧光光子;转换器,被配置为放大荧光光子并将放大的荧光光子转换为荧光信号;测量器,其被配置为通过使用将通过将荧光信号的函数积分而获得的值乘以模拟函数而获得的函数来分析荧光信号的函数的数据。

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