Uncertainties of VNA S-Parameter Measurements Applying the TAN Self-Calibration Method

摘要

For the seven-term general through–attenuator–network (TAN) self-calibration method of a four-sampler vector network analyzer and for all derived calibration methods such as through–line–network, through–reflect–line, through–reflect–match, through–attenuator–reflect, or through–match–network, expressions for the deviations of the measured S-parameters of two-port test objects (device under test) from their true values, which are caused by deviations of the S-parameters of nonideal calibration elements (“standards”) from their ideal values, are presented. These sensitivity coefficients can be used for establishing the type-B uncertainty budget for S-parameter measurements.