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Null Detector Circuit Design Scheme for Detecting Defective AC-Coupled Capacitors in Differential Signaling

机译:用于检测差分信号中交流耦合电容不良的零检测器电路设计方案

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This paper presents a novel method for detecting defective ac-coupling capacitors in high-speed differential signaling connections by designing a circuit with null detectors at the differential receiver. The design parameters of selecting the null ranges in the receiver buffer are proposed to efficiently detect the voltage droop that creates erroneous jitter. The null detectors in the proposed method enable the use of a lower test signal speed than the mission data rate at differential connections to detect defective capacitors. The proposed design method of null detectors combines four design and test factors, namely, regular null, voltage doubling, fail–safe, and defect sensitization, to determine the stretched null used for test purposes. The null-detection scheme has been implemented and verified in the design using a regular current-mode logic (CML) differential buffer in the 0.18- $muhbox{m}$ complementary metal–oxide–semiconductor (CMOS) process. The detection capability of the proposed method to check for traditional defects with the same null detector is also demonstrated through SPICE-based fault simulations. The proposed method is also verified with the board developed for parameter measurements. The parameters proposed in this paper showed excellent agreement among calculated, simulated, and measured values. In particular, measured parameters showed strong closeness up to 99% to its calculated values.
机译:本文提出了一种通过在差分接收器处设计带有零检测器的电路来检测高速差分信号连接中有缺陷的交流耦合电容器的新方法。提出了在接收器缓冲器中选择零位范围的设计参数,以有效地检测产生错误抖动的电压下降。所提出的方法中的空检测器能够使用比差分连接处的任务数据速率更低的测试信号速度来检测有故障的电容器。提议的零点检测器设计方法结合了四个设计和测试因素,即常规零点,倍压,故障安全和缺陷敏感度,以确定用于测试目的的拉伸零点。零检测方案已在设计中使用常规电流模式逻辑(CML)差分缓冲器在0.18-μmHbox{m} $互补金属-氧化物-半导体(CMOS)工艺中实现和验证。通过基于SPICE的故障仿真也证明了该方法用相同的零检测器检查传统缺陷的检测能力。开发的用于参数测量的开发板也验证了所提出的方法。本文提出的参数在计算值,模拟值和测量值之间显示出极好的一致性。特别是,所测得的参数显示出与其计算值的高达99%的紧密度。

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