首页> 外文期刊>Innovations in processing and packaging >Key Technology introduces CIT~® hyperspectral imaging module for ADR~® 5 to detect and remove 'sugar end' defects from potato strips
【24h】

Key Technology introduces CIT~® hyperspectral imaging module for ADR~® 5 to detect and remove 'sugar end' defects from potato strips

机译:关键技术推出了用于ADR〜®5的CIT〜®高光谱成像模块,以检测和去除马铃薯条中的“糖味”缺陷

获取原文
获取原文并翻译 | 示例
       

摘要

Key Technology introduces hyperspectral imaging on its popular ADR~® 5 automatic defect removal system for potato strips. Featuring Chemical Imaging Technology (CIT~®), an advanced value-added hyperspectral solution that evaluates the chemical composition of objects, CIT detects "sugar ends," an invisible defect that plagues potato processors, which the ADR then cuts from the wet strips, along with all other defects, to recover the good product. ADR 5 with CIT detects and removes sugar ends and other defects from potato strips to improve product quality while maximizing yields.
机译:关键技术公司在其流行的ADR〜®5马铃薯条自动缺陷去除系统上引入了高光谱成像。 CIT具有化学成像技术(CIT〜®),它是一种先进的增值高光谱解决方案,可评估物体的化学成分,可检测“糖端”,这是一种困扰马铃薯加工者的无形缺陷,ADR随后将其从湿条切下,连同所有其他缺陷,以恢复良好的产品。带有CIT的ADR 5可检测并去除马铃薯条中的糖味残端和其他缺陷,从而在提高产量的同时提高产品质量。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号