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Extending the Best Linear Approximation to Characterize the Nonlinear Distortion in GaN HEMTs

机译:扩展最佳线性近似值以表征GaN HEMT中的非线性失真

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In this paper, the best linear approximation (BLA) is extended to include second-order nonlinearities. This extension is particularly useful for the analysis of low-frequency (LF) distortion due to self-mixing. The self-mixing of a modulated signal due to even-order nonlinear distortion creates a spectrum around dc, as well as around the high order even harmonics. The frequency response at dc can be used to determine long-term memory effects such as trapping and self-heating. The extended BLA is extracted for a GaN-based HEMT to analyze the LF distortion and demonstrate the possibilities with the proposed method.
机译:本文将最佳线性逼近(BLA)扩展为包括二阶非线性。该扩展对于分析由于自混频引起的低频(LF)失真特别有用。由于偶数阶非线性失真而导致的调制信号的自混频会在dc以及高阶偶数谐波周围产生一个频谱。直流频率响应可用于确定长期记忆效应,例如陷波和自热。针对基于GaN的HEMT提取了扩展的BLA,以分析LF失真并证明了所提出方法的可能性。

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