首页> 外文期刊>Device and Materials Reliability, IEEE Transactions on >Accelerated Testing of Radiation-Induced Soft Errors in Solid-State Drives
【24h】

Accelerated Testing of Radiation-Induced Soft Errors in Solid-State Drives

机译:加速测试固态驱动器中的辐射引起的软错误

获取原文
获取原文并翻译 | 示例

摘要

Accelerated soft error testing with neutron and proton beams was done on a variety of solid-state drives. Effects included temporary hangs, permanent drive failure, and both detected and silent data corruption. Projected rates for sea-level cosmic rays vary widely from model to model, which is arguably insignificant for some but problematic for others. Design protections for reducing soft error sensitivity are discussed and evaluated for effectiveness. Radiation testing was able to detect silent data corruption at levels 10 000 times lower than can be detected in a conventional reliability demonstration test. We argue that accelerated testing should be a standard part of drive design validation.
机译:在各种固态驱动器上使用中子和质子束进行了加速的软错误测试。影响包括临时挂起,永久性驱动器故障以及检测到的数据和静默数据损坏。海平面宇宙射线的预计发射率因模型而异,对于某些模型而言可谓微不足道,但对于其他模型而言则存在问题。讨论了降低软错误敏感性的设计保护措施,并评估了有效性。辐射测试能够检测到无声数据损坏,其级别比常规可靠性演示测试所能检测到的低10 000倍。我们认为加速测试应该成为驱动器设计验证的标准部分。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号