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首页> 外文期刊>IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems >Transistor-level estimation of worst-case delays in MOS VLSI circuits
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Transistor-level estimation of worst-case delays in MOS VLSI circuits

机译:MOS VLSI电路中最坏情况延迟的晶体管级估计

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The authors present three algorithms for efficient worst-case delay estimation in transistor groups using transistor-level delay models and timing simulation techniques. The first algorithm, dynamic path selection (DPS), determines the path with the longest delay in a transistor group. If the group consists of series-parallel transistor combinations, the time complexity is linear. The second algorithm, delay subnetwork enumeration (DSE), complements the DPS method by taking into account logic dependencies. The paths with the shortest delay are computed using the dynamic cut selection (DCS) algorithm. These techniques have been implemented in the static timing analyzer TAMIA to provide fast and accurate worst-case delay estimation for digital CMOS circuits.
机译:作者介绍了使用晶体管级延迟模型和时序仿真技术在晶体管组中进行有效的最坏情况延迟估计的三种算法。第一种算法是动态路径选择(DPS),它确定晶体管组中具有最长延迟的路径。如果该组由串联-并联晶体管组合组成,则时间复杂度为线性。第二种算法是延迟子网枚举(DSE),它通过考虑逻辑依赖性来补充DPS方法。使用动态切割选择(DCS)算法计算具有最短延迟的路径。这些技术已在静态时序分析器TAMIA中实现,以为数字CMOS电路提供快速准确的最坏情况延迟估计。

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