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Pattern independent maximum current estimation in power and ground buses of CMOS VLSI circuits: Algorithms, signal correlations, and their resolution

机译:CMOS VLSI电路的电源和接地总线中与模式无关的最大电流估计:算法,信号相关性及其分辨率

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Currents flowing in the power and ground (P&G) buses of CMOS digital circuits affect both circuit reliability and performance by causing excessive voltage drops. Excessive voltage drops manifest themselves as glitches on the P&G buses and cause erroneous logic signals and degradation in switching speeds. Maximum current estimates are needed at every contact point in the buses to study the severity of the voltage drop problems and to redesign the supply lines accordingly. These currents, however, depend on the specific input patterns that are applied to the circuit. Since it is prohibitively expensive to enumerate all possible input patterns, this problem has, for a long time, remained largely unsolved. In this paper, we propose a pattern-independent, linear time algorithm (iMax) that estimates at every contact point, an upper bound envelope of all possible current waveforms that result by the application of different input patterns to the circuit. The algorithm is extremely efficient and produces good results for most circuits as is demonstrated by experimental results on several benchmark circuits. The accuracy of the algorithm can be further improved by resolving the signal correlations that exist inside a circuit. We also present a novel partial input enumeration (PIE) technique to resolve signal correlations and significantly improve the upper bounds for circuits where the bounds produced by iMax are not tight. We establish with extensive experimental results that these algorithms represent a good time-accuracy trade-off and are applicable to VLSI circuits.
机译:CMOS数字电路的电源和接地(P&G)总线中流动的电流会引起过多的压降,从而影响电路的可靠性和性能。过多的压降表现为P&G总线上的毛刺,并导致错误的逻辑信号和开关速度降低。总线中每个接触点都需要最大电流估计值,以研究电压降问题的严重程度并相应地重新设计电源线。但是,这些电流取决于施加到电路的特定输入模式。由于枚举所有可能的输入模式非常昂贵,因此长期以来,这个问题一直未得到解决。在本文中,我们提出了一种与模式无关的线性时间算法(iMax),该算法在每个接触点处估算所有可能的电流波形的上限包络,这些波形是由于将不同的输入模式应用于电路而产生的。该算法非常有效,并且可以在大多数电路上产生良好的结果,如几个基准电路上的实验结果所证明。通过解决电路内部存在的信号相关性,可以进一步提高算法的准确性。我们还提出了一种新颖的部分输入枚举(PIE)技术,以解决信号相关性并显着提高iMax产生的边界不紧密的电路的上限。我们通过广泛的实验结果证明,这些算法代表了良好的时间精度折衷,并且适用于VLSI电路。

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