Prediction of RFI demodulation in BiFET, BiMOS and CMOS operational amplifiers

摘要

A model is proposed for the differential-input-voltage/output-current characteristic of JFET and MOSFET differential amplifiers. Using this model a closed-form expression is derived for the output signal of BiFET, BiMOS and CMOS operational amplifiers excited by a multisinusoidal input signal. Using this expression, the RFI demodulation in these operational amplifiers can be predicted.