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General large-signal charge-control equations for the MOSFET drainand source current under nonquasistatic conditions

机译:非准静态条件下MOSFET漏极和源极电流的一般大信号充电控制方程式

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General large-signal charge-control equations for the drain andnsource terminal currents of the long-channel MOSFET on a previouslynproposed recursion relation are presented. These equations arenphysically derived following Van Nielen's iterative procedure to revealnthe relaxation mechanism in the MOSFET channel under nonquasistaticnconditions. The relation between the channel charge partitioning modelnand the general theoretical development is discussed. This makes itnpossible to put various solution techniques reported for the MOSFETnnonquasistatic problem into perspective. Within the theoreticalnframework of this work, it is observed that, in general, the drain andnsource currents share a common relaxation time. The generalncharge-control equations presented in the paper differ from the simplenfirst-order nonquasistatic current equations, in that they incorporatencorrection terms to account for the otherwise neglected high-ordernnonquasistatic effects. Quasistatic formulation of these correctionnterms is used to illustrate their effects on transient response. It isnshown that consistency in the introduction of such correction terms tonspecific models is crucial to the continuity in current valuesnthroughout the transient
机译:提出了在先前提出的递归关系下,长沟道MOSFET的漏极和源极端子电流的一般大信号电荷控制方程。这些方程是根据范尼伦的迭代程序从物理学上导出的,以揭示非准静态条件下MOSFET沟道中的弛豫机制。讨论了信道电荷分配模型与一般理论发展之间的关系。这使得不可能将针对MOSFET非准静态问题而报告的各种解决方案技术加以考虑。在这项工作的理论框架内,可以观察到,通常,漏极和源极电流共享一个共同的弛豫时间。本文提出的一般电荷控制方程与简单的一阶非准静态电流方程不同,因为它们结合了校正项以解决原本可以忽略的高阶非准静态效应。这些校正项的拟静态公式用来说明它们对瞬态响应的影响。没有显示在整个瞬态中引入此类校正项的一致性对于电流值的连续性至关重要。

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