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Submicron-gate-length GaAs MESFETs

机译:亚微米栅长GaAs MESFET

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It is well known that reducing gate length is a powerful means to increase the transconductance and transit frequency of GaAs MESFET devices. However, by reducing the gate length without scaling channel doping and thickness, the performance obtained is limited by short-channel effects and parasitics. In this paper we present an overview of our work on two different MESFET structures, illustrating how device performance can be increased by decreasing the gate length, with the result that appropriately scaled MESFETs compare favorably with GaAs-AlGaAs heterojunction FETs. From our work—including some recent results on 0.15-µm-gate-length implantation-self-aligned MESFETs—we conclude that it should be possible to increase the speed of high-speed GaAs MESFET (logic, analog, and microwave) circuits through the use of devices having gate lengths less than 0.5 µm.
机译:众所周知,减小栅极长度是增加GaAs MESFET器件跨导和传输频率的有力手段。然而,通过减小栅极长度而不缩放沟道掺杂和厚度,所获得的性能受到短沟道效应和寄生效应的限制。在本文中,我们概述了我们在两种不同的MESFET结构上的工作,展示了如何通过减小栅极长度来提高器件性能,其结果是,适当缩放的MESFET与GaAs-AlGaAs异质结FET相比具有优势。从我们的工作(包括有关0.15 µm栅极长度注入的自对准MESFET的一些最新结果),我们得出结论,应该有可能通过以下方法提高高速GaAs MESFET(逻辑,模拟和微波)电路的速度使用栅极长度小于0.5 µm的器件。

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