The damage depth profile effect on hydrogen isotope retention behavior in heavy ion irradiated tungsten

摘要

Highlights•The damage depth profile effect by heavy-ion irradiation on hydrogen isotope retention in W was evaluated.•The depth profile of D in the damaged W was simulated by HIDT simulation code.•D de-trapping from irradiation defects at lower temperature would be enhanced by the accumulation of defect near the surface.•Irradiation defect distribution would affect on hydrogen isotope behavior in W.AbstractTo evaluate the damage depth profile effect on hydrogen isotope retention in tungsten (W), combination usage of 0.8MeV and 6.0MeV Fe ions were implanted into W with the damage concentrations between 0.03 and 0.1 dpa. Thereafter, 1.0keV deuterium ion (D2+) implantation was performed with the flux of 1.0×1018D+m−2s−1up to the fluence of 1.0×1022D+m−2, and the D retention behavior was evaluated by thermal desorption spectroscopy (TDS). The experimental results indicated that 6.0MeV Fe ion irradiation would introduce vacancies and voids into bulk that were clearly controlled by the damage concentration, and the voids would become the most stable D trapping sites. It was found that D de-trapping from irradiation defects at lower temperature would be enhanced by the accumulation of defect near the surface due to 0.8MeV Fe ion irradiation.