首页> 外国专利> Method determining depth profile of radioactive isotope activity, involves determining activity of removed layer by measuring activity of radioactive isotopes, and inserting measuring values and layer thickness values into activity profile

Method determining depth profile of radioactive isotope activity, involves determining activity of removed layer by measuring activity of radioactive isotopes, and inserting measuring values and layer thickness values into activity profile

机译:确定放射性同位素活性深度分布的方法,包括通过测量放射性同位素的活性来确定被去除的层的活性,并将测量值和层厚度值插入到放射性分布中

摘要

The method involves preparing a reference body (1), that is provided with radioactive isotopes, in an activation region (2) close to a surface. A layer (x1-xn) of a material on a measuring region (3) of the body is removed. Thickness of the removed layer is determined by comparison with reference marks (R1-R3). An activity of the removed layer is determined by measuring an activity of the isotopes, before and after the removal of the material layer. The radioactive activity measuring values and the layer thickness values are inserted into an activity depth profile. Independent claims are also included for the following: (1) a measuring system for determining a depth profile of an activity of a radioactive isotope on a reference body (2) a method for tribometric, high-resolution online determination of wear on sample bodies (3) a measuring arrangement for tribometric, high-resolution online determination of wear on sample bodies.
机译:该方法包括在靠近表面的活化区域(2)中制备具有放射性同位素的参比体(1)。去除在身体的测量区域(3)上的材料层(x1-xn)。通过与参考标记(R1-R3)比较来确定去除层的厚度。通过在去除材料层之前和之后测量同位素的活性来确定去除的层的活性。将放射性活度测量值和层厚值插入到活度深度分布图中。还包括以下方面的独立权利要求:(1)用于确定放射性同位素在参考体上的活性的深度分布的测量系统(2)用于通过摩擦学,高分辨率在线确定样品体磨损的方法( 3)测量装置,用于通过摩擦学,高分辨率在线确定样品体的磨损。

著录项

  • 公开/公告号AT504138B1

    专利类型

  • 公开/公告日2008-03-15

    原文格式PDF

  • 申请/专利权人 AC2T RESEARCH GMBH;

    申请/专利号AT20060002132

  • 发明设计人

    申请日2006-12-22

  • 分类号G01N3/56;G01N17;G01N17/04;

  • 国家 AT

  • 入库时间 2022-08-21 20:04:40

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