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Atomic Force Microscopy Imaging of Food Polysaccharides

机译:食品多糖的原子力显微镜成像

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摘要

Atomic force microscopy (AFM) is a type of scanning probe microscopy that generates images (primarily topographical ones) by scanning the surface of samples with a sharp tip. AFM is applicable to samples with low electric conductivities, and its operating range spans that accessible to both light and electron microscopes, allowing for molecular resolution. These features of AFM enable soft materials to be visualized under natural conditions without harsh or damaging procedures. For food polysaccharides, AFM is capable of visualizing not only dispersed molecules but also molecular assemblies with an advantage over other physical techniques in quantifying the heterogeneity of samples. From these perspectives, AFM is one of the most versatile techniques for obtaining structural information on food polysaccharides, contributing to the progress of this research area. In this article, AFM images of various food polysaccharides are presented along with the usefulness and limitations of this microscopy technique.
机译:原子力显微镜(AFM)是一种扫描探针显微镜,它通过用尖锐的尖端扫描样品表面来生成图像(主要是地形图)。 AFM适用于低电导率的样品,其工作范围跨越了光学和电子显微镜均可访问的范围,从而实现了分子分辨率。 AFM的这些功能使软材料可以在自然条件下可视化,而无需进行苛刻或破坏性操作。对于食品多糖,AFM不仅可以可视化分散的分子,而且还可以可视化分子组装,在定量样品的异质性方面优于其他物理技术。从这些角度来看,原子力显微镜是获得食品多糖结构信息的最通用的技术之一,为该研究领域的发展做出了贡献。在本文中,将介绍各种食品多糖的AFM图像以及该显微镜技术的实用性和局限性。

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