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A 1 TB/s 1 pJ/b 6.4 ${rm mm}^{2}/{rm TB/s}$ QDR Inductive-Coupling Interface Between 65-nm CMOS Logic and Emulated 100-nm DRAM

机译:65纳米CMOS逻辑与仿真100纳米DRAM之间的1 TB / s 1 pJ / b 6.4 $ {rm mm} ^ {2} / {rm TB / s} $ QDR电感耦合接口

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1 TB/s 1 pJ/b 6.4 ${rm mm}^{2}/{rm TB/s}$ inductive-coupling interface between 65-nm complementary metal–oxide–semiconductor (CMOS) logic and emulated 100-nm dynamic random access memory (DRAM) is developed. ${rm BER}<10^{-16}$ operation is examined in 1024-bit parallel links. Compared to the latest wired 40-nm DRAM interface, the bandwidth is increased to 32$times$ , and the energy consumption and the layout area are reduced to 1/8 and 1/22, respectively.
机译:1 TB / s 1 pJ / b 6.4 $ {rm mm} ^ {2} / {rm TB / s} $ 65-nm互补金属-氧化物-半导体(CMOS)逻辑与仿真的100-nm动态之间的电感耦合接口开发了随机存取存储器(DRAM)。在1024位并行链接中检查$ {rm BER} <10 ^ {-16} $操作。与最新的40-nm有线DRAM接口相比,带宽增加到32倍,能耗和布局面积分别减少到1/8和1/22。

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