Monolithic InP-based grating spectrometer for wavelength-division multiplexed systems at 1.5 mu m

摘要

A monolithic InP-based grating spectrometer for use in wavelength-division multiplexed systems at 1.5 mu m is reported. The spectrometer uses a single etched reflective focusing diffraction grating and resolves <50 channels at 1 nm spacing with a approximately 0.3 nm channel width and at least 19 dB channel isolation. Operation is essentially of the state of the input polarisation.