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Design of ESD protection device using body floating technique in 65 nm CMOS process

机译:采用体浮技术在65 nm CMOS工艺中设计ESD保护器件

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摘要

A floating body electrostatic discharge (ESD) protection circuit positioned between and coupled to an I/O pad and an internal circuit is presented. A small NMOS transistor is used to control the body of a main NMOS transistor. When the small NMOS transistor is triggered, the body of the main NMOS transistor remains grounded. If the small NMOS transistor has not been triggered, the body of the main NMOS transistor remains in a floating state, lowering the range of the snapback voltage. As a consequence the ESD protection circuit is able to function more rapidly. The proposed ESD protection circuit is designed in 65 nm CMOS technology.
机译:提出了一种浮体静电放电(ESD)保护电路,该电路位于I / O焊盘与内部电路之间并与之耦合。小型NMOS晶体管用于控制主NMOS晶体管的主体。当小型NMOS晶体管被触发时,主NMOS晶体管的主体保持接地。如果尚未触发小型NMOS晶体管,则主NMOS晶体管的主体将保持浮置状态,从而降低了骤回电压的范围。结果,ESD保护电路能够更快地起作用。拟议的ESD保护电路采用65 nm CMOS技术设计。

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  • 来源
    《Electronics Letters》 |2011年第19期|p.1072-1073|共2页
  • 作者单位

    Department of Electronic Engineering, Seokyeong University, 16-1 Jungneung-dong, Sungbuk-gu, Seoul, Republic of Korea;

    Department of Electronics & Electrical Engineering, Dankook University, 126 Jukjeon-dong, Suji-gu, Yonginsi, Gyeonggi-do, Republic of Korea;

    Electronics and Telecommunications Research Institute, 161 Gajeong-dong, Yuseong-gu, Daejeon, Republic of Korea;

    Department of Electronics & Electrical Engineering, Dankook University, 126 Jukjeon-dong, Suji-gu, Yonginsi, Gyeonggi-do, Republic of Korea;

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