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Histogram-based mixed-signal time-to-digital-converter array for direct time-of-flight depth sensors

机译:基于直方图的混合信号时间到数字转换器阵列,用于直接飞行时间深度传感器

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This Letter introduces a histogram-based time-to-digital-converter (TDC) array for direct time-of-flight depth sensors. The 12-bit TDC array measures the time of flight (TOF) of a light pulse that is detected using an external single-photon avalanche diode (SPAD) array. As SPADs are noisy owing to dark electrons and scattered photons, statistical measurements based on histograms are essential, but require a large memory. In this work, the authors propose a mixed-signal TDC with an integrated histogram generation unit (HGU) that reduces memory requirement significantly as well as filters out invalid TOF readings. In addition, for application of the high-resolution SPAD array, an area-efficient TDC array with high uniformity was implemented by the proposed phase-dependent latching and temporal double sampling schemes. The prototype chip was fabricated using a 180 nm CMOS process, including 8-channel TDCs. The measurements show an integral non-linearity (INL)/a differential nonlinearity (DNL) of 0.76/0.49 least significant bit (LSB) and high uniformity under 0.19 LSB. The HGU was designed off-chip for prior verification, and was post-simulated with the measured TOF from the fabricated chip. Using the histogram-based TDC, the authors could detect an object located at a distance of 3 m accurately while reducing memory requirement by more than 128 times.
机译:这封信引入了基于直方图的时间到数字转换器(TDC)阵列,用于直接飞行时间深度传感器。 12位TDC阵列测量使用外部单光子雪崩二极管(SPAD)阵列检测的光脉冲的飞行时间(TOF)。由于朝向暗电子和散射光子的辐射,由于散射光子,基于直方图的统计测量是必不可少的,但需要大的内存。在这项工作中,作者提出了一种混合信号TDC,其具有集成的直方图生成单元(HGU),可显着降低内存要求以及过滤器OUT无效的TOF读数。另外,对于高分辨率SPAD阵列的应用,通过所提出的相位锁存和时间双采样方案来实现具有高均匀性的区域有效的TDC阵列。使用180nm CMOS工艺制造原型芯片,包括8通道TDC。测量显示为0.76 / 0.49的差分非线性(INL)/差分非线性(DNL),其最低有效位(LSB)和0.19LSB下的高均匀性。 HGGU是在芯片上设计的,以进行现有验证,并用来自制造芯片的测量TOF后模拟。使用基于直方图的TDC,作者可以在精确地检测位于3米的距离的对象,同时通过128次降低内存要求。

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