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A 64 fJ/step 9-bit SAR ADC Array With Forward Error Correction and Mixed-Signal CDS for CMOS Image Sensors

机译:具有前向纠错功能和混合信号CDS的64 fJ / step 9位SAR ADC阵列,用于CMOS图像传感器

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A 9 b Successive-Approximation-Register (SAR) Anglog-to-Digital Converter (ADC) with pilot-Digital-to-Analog Converter (pDAC) technique for image sensor applications is described in this paper}. Its Forward Error Correction (FEC) improves its robustness against device mismatch. It performs mixed-signal Correlated-Double-Sampling (CDS) using only the ADC's built-in capacitor array without any additional amplifier or memory. The ADC measures and is demonstrated in a low-power CMOS image sensors with column parallel ADCs. Measurement results from the prototype image sensor in 0.18 technology shows that the ADC's Differential Non-Linearity (DNL) is reduced from 3.5 LSB to 1.2 LSB by its mixed-signal FEC algorithm, making its Figure-of-Merit (FoM) 64 fJ/step. Furthermore, when combined with the ADC's mixed-signal Correlated-Double-Sampling, the column FPN is reduced from 3.2% to 0.5% without any additional circuit.
机译:本文介绍了一种9 b逐次逼近寄存器(SAR)角对数字转换器(ADC)和导频数模转换器(pDAC)技术,用于图像传感器应用}。其前向纠错(FEC)改善了其抗设备失配的稳定性。它仅使用ADC的内置电容器阵列执行混合信号相关双采样(CDS),而无需任何其他放大器或存储器。 ADC测量并在具有列并行ADC的低功耗CMOS图像传感器中得到了证明。采用0.18技术的原型图像传感器的测量结果表明,通过其混合信号FEC算法,ADC的差分非线性(DNL)从3.5 LSB降低至1.2 LSB,其品质因数(FoM)为64 fJ /步。此外,当与ADC的混合信号相关双采样组合使用时,列FPN将从3.2%降低至0.5%,而无需任何附加电路。

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