首页> 外文期刊>Electronics and communications in Japan >MEMS Wafer-Level Packaging Technology Using LTCC Wafer
【24h】

MEMS Wafer-Level Packaging Technology Using LTCC Wafer

机译:使用LTCC晶圆的MEMS晶圆级封装技术

获取原文
获取原文并翻译 | 示例
       

摘要

This paper describes a versatile and reliable waferlevel hermetic packaging technology using an anodically bondable low-temperature co-fired ceramic (LTCC) wafer, in which multilayer electrical feedthroughs can be embedded. The LTCC wafer allows many kinds of micro-electromechanical systems (MEMS) to be more flexibly designed and more easily packaged. The hermeticity of vacuum-sealed cavities was confirmed after 3000 cycles of thermal shock (-40 ℃ × 30 min/+125 ℃ × 30 min) by the diaphragm method. To practically apply the LTCC wafer to a variety of MEMS, the electrical connection between the MEMS on a Si wafer and feedthroughs in the LTCC should be established by a simple and reliable method. We have developed a new electrical connection method: the electrical connection is established by porous Au bumps, which are part of the Au vias exposed in wet-etched cavities on the LTCC wafer. A 100% yield of both electrical connection and hermetic sealing was demonstrated. A thermal shock test up to 3000 cycles confirmed the reliability of this packaging technology.
机译:本文介绍了一种使用可阳极氧化的低温共烧陶瓷(LTCC)晶片的通用且可靠的晶片级气密封装技术,其中可以嵌入多层电引线。 LTCC晶片使许多微机电系统(MEMS)可以更灵活地设计并且更容易封装。在3000次热冲击后(-40℃×30min / + 125℃×30min),采用隔膜法确定了真空密封腔的气密性。为了将LTCC晶圆实际应用于各种MEMS,应通过一种简单可靠的方法在Si晶圆上的MEMS与LTCC中的馈通之间建立电连接。我们已经开发出一种新的电连接方法:通过多孔的Au凸点建立电连接,Au凸点是暴露在LTCC晶片上的湿蚀刻腔中的Au通孔的一部分。证明了电连接和气密密封两者的产率均为100%。高达3000个循环的热冲击测试证实了这种包装技术的可靠性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号