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Performance of vertically coupled backside fiber-optic interconnections to GaAs

机译:与GaAs垂直耦合的背面光纤互连的性能

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Summary form only given. A vertical coupling technique suited for dense fiber-optic interconnection of two-dimensional device arrays in GaAs has recently been developed. It uses cavities etched in the backside of the wafer to align each fiber to a diaphragm photodetector (DPD) fabricated on the front-surface epitaxial layers. Operation of the fiber-pigtailed DPDs is described. Enhanced optoelectronic performance due to the backside approach as well as the capability of addressing interconnect arrays with approximately 10 fibers/mm/sup 2/ is reported.
机译:仅提供摘要表格。最近已经开发了适合于GaAs中的二维器件阵列的密集光纤互连的垂直耦合技术。它使用在晶圆背面蚀刻的腔体将每根光纤对准在前表面外延层上制造的隔膜光电检测器(DPD)。描述了光纤尾纤DPD的操作。据报道,由于采用了背面方法,从而提高了光电性能,并具有以大约10根光纤/ mm / sup 2 /寻址互连阵列的能力。

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