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High-transconductance InGaAs/InAlAs SISFETs

机译:高跨导InGaAs / InAlAs SISFET

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Summary form only given. SISFETs in the InGaAs/InAlAs lattice-matched-to-InP material system with record transconductance have been fabricated. These devices use an InGaAs channel layer grown on an InAlAs buffer layer grown on (and lattice matched to) a semi-insulating InP substrate. Carriers are induced in the undoped channel layer by the action of a doped InGaAs gate layer acting across an undoped InAlAs insulating layer. The device is thus the analog of the GaAs/AlGaAs SISFET (or more broadly the silicon gate MOSFET) but provides the electron transport advantages of InGaAs. In addition, ion implantation and arsine overpressure rapid thermal annealing of shallow implants into InGaAs were studied, and it was found that shallow self-aligning implantation structures can be achieved with much lower resistance than in GaAs.
机译:仅提供摘要表格。已经制造出具有记录跨导的InGaAs / InAlAs晶格匹配InP材料系统中的SISFET。这些器件使用生长在InAlAs缓冲层上的InGaAs沟道层,该缓冲层生长在半绝缘InP衬底上(并晶格匹配)。通过跨过未掺杂的InAlAs绝缘层的掺杂的InGaAs栅极层的作用,在未掺杂的沟道层中感应出载流子。因此,该器件是GaAs / AlGaAs SISFET(或更广泛地说是硅栅极MOSFET)的模拟,但具有InGaAs的电子传输优势。另外,对InGaAs中的浅注入的离子注入和a过压快速热退火进行了研究,发现与GaAs相比,可以以低得多的电阻实现浅自对准注入结构。

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