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An analytical a-Si:H TFT DC/capacitance model using an effective temperature approach for deriving a switching time model for an inverter circuit considering deep and tail states

机译:使用有效温度方法的a-Si:H TFT DC /电容分析模型,用于导出考虑深尾状态的逆变器电路的开关时间模型

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This paper presents an analytical a-Si:H DC/capacitance model using an effective temperature approach for deriving a switching time model for an inverter circuit considering deep and tail states. Using an effective temperature approach, the localized deep and tail states have been considered in the DC/capacitance model and the switching time model. As verified by the published data, the analytical DC/capacitance model provides an accurate prediction. Based on the analytical model, the threshold voltage of an a-Si:H TFT is proportional to the deep state density and the switching time of the TFT-inverter is dependent on the tail state density.
机译:本文介绍了一种使用有效温度方法的a-Si:H DC /电容分析模型,用于推导考虑深尾状态的逆变器电路的开关时间模型。使用有效的温度方法,已经在DC /电容模型和开关时间模型中考虑了局部的深度和尾部状态。正如已发布的数据所验证的那样,分析型DC /电容模型可提供准确的预测。基于分析模型,a-Si:H TFT的阈值电压与深态密度成正比,而TFT反相器的开关时间取决于尾态密度。

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