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首页> 外文期刊>IEEE Transactions on Electron Devices >Investigation of Si/SiGe-based FET geometries for high frequency performance by computer simulation
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Investigation of Si/SiGe-based FET geometries for high frequency performance by computer simulation

机译:通过计算机仿真研究基于Si / SiGe的FET几何形状以实现高频性能

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摘要

The high frequency performance of n-channel Si/SiGe-based FETs is investigated by computer simulation. Using a two-dimensional hydrodynamic model, devices having gate lengths down to 0.1 /spl mu/m are examined. Self-aligned heterojunction MOSFETs are found to offer the best performance in terms of cut-off frequency and available voltage gain. Schottky gate heterojunction FETs have the highest transconductance in this study, but simulations confirm that this is because of the close proximity of the channel to the gate. Depletion mode MOS gate devices are also considered and a large parameter space is explored.
机译:通过计算机仿真研究了基于N沟道Si / SiGe的FET的高频性能。使用二维流体动力学模型,研究了浇口长度低至0.1 / spl mu / m的设备。发现自对准异质结MOSFET在截止频率和可用电压增益方面可提供最佳性能。肖特基栅极异质结FET在本研究中具有最高的跨导,但是仿真证实这是由于沟道与栅极的紧密接近。还考虑了耗尽型MOS栅极器件,并探索了较大的参数空间。

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