Characterization of inversion and accumulation layer electron transport in 4H and 6H-SiC MOSFETs on implanted P-type regions

摘要

The silicon carbide double implanted vertical MOSFET (SiC DIMOS) is a promising candidate for high power switching applications due to the absence of high electric field corners and compatibility with planar IC technology. In this work, we report on the channel mobility behavior in 4H and 6H-SiC MOSFETs fabricated with a low thermal budget process sequence, on implanted p-type regions which mirror the lateral carrier transport region in the DIMOS device. Channel mobilities are higher by an order of magnitude in 6H-SiC compared to 4H-SiC MOSFET's suggesting the 6H-SiC polytype is better suited for fabricating the DIMOS structure in spite of the superior vertical bulk conduction in 4H-SiC. Moreover, channel mobility on accumulated surfaces is higher than values obtained on inverted surfaces. A strong correlation between the observed threshold voltages and channel mobilities is consistently explained by a modified MOSFET conductance formulation in the presence of slowly decaying bandtail states toward the SiC band edges.