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首页> 外文期刊>IEEE Transactions on Electron Devices >Performance of the floating gate/body tied NMOSFET photodetector on SOI substrate
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Performance of the floating gate/body tied NMOSFET photodetector on SOI substrate

机译:SOI衬底上的浮栅/体绑式NMOSFET光电探测器的性能

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In this paper, we report the performance of a new photodetector fabricated on SOI substrate using a standard CMOS process. The photodetector is formed by connecting the gate and the body of a NMOSFET. The gate-body terminal is left floating so that the potential can be modulated by illumination. The depletion region induced by the floating gate separates the optically generated electron-hole pairs in the direction perpendicular to the current. This increases the body potential and induces positive charges to the gate due to the tied gate and body. It results in a further turn on of the NMOSFET and extra optical current. The gain behavior under different illumination is characterized and explained by transistor theory. A wide signal range of more than six orders of magnitude and a high responsivity of about 1000 A/W have been obtained with an operating voltage as low as 0.2 V. The device scaling properties, noise behavior and transient response are also studied.
机译:在本文中,我们报告了使用标准CMOS工艺在SOI基板上制造的新型光电探测器的性能。通过连接NMOSFET的栅极和主体来形成光电探测器。栅极主体端子悬空,以便可以通过照明来调制电势。浮栅引起的耗尽区在垂直于电流的方向上分离了光学产生的电子-空穴对。由于门和身体的联系,这会增加身体的电势并向门感应正电荷。这会导致NMOSFET进一步导通并产生额外的光电流。通过晶体管理论来表征和解释不同光照下的增益行为。在低至0.2 V的工作电压下,已经获得了超过六个数量级的宽信号范围和大约1000 A / W的高响应度。还研究了器件的缩放特性,噪声特性和瞬态响应。

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