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640/spl times/486 long-wavelength two-color GaAs/AlGaAs quantum well infrared photodetector (QWIP) focal plane array camera

机译:640 / spl次/ 486长波长两色GaAs / AlGaAs量子阱红外光电探测器(QWIP)焦平面阵列相机

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We have designed and fabricated an optimized long-wavelength/very-long wavelength two-color quantum well infrared photodetector (QWIP) device structure. The device structure was grown on a 3-in semi-insulating GaAs substrate by molecular beam epitaxy (MBE). The wafer was processed into several 640/spl times/486 format monolithically integrated 8-9 and 14-15 /spl mu/m two-color (or dual wavelength) QWIP focal plane arrays (FPAs). These FPAs were then hybridized to 640/spl times/486 silicon CMOS readout multiplexers. A thinned (i.e., substrate removed) FPA hybrid was integrated into a liquid helium cooled dewar for electrical and optical characterization and to demonstrate simultaneous two-color imagery. The 8-9 /spl mu/m detectors in the FPA have shown background limited performance (BLIP) at 70 K operating temperature for 300 K background with f/2 cold stop. The 14-15 /spl mu/m detectors of the FPA reaches BLIP at 40 K operating temperature under the same background conditions. In this paper we discuss the performance of this long-wavelength dualband QWIP FPA in terms of quantum efficiency, detectivity, noise equivalent temperature difference (NE/spl Delta/T), uniformity, and operability.
机译:我们已经设计并制造了优化的长波长/超长波长双色量子阱红外光电探测器(QWIP)器件结构。器件结构通过分子束外延(MBE)在3英寸半绝缘GaAs衬底上生长。将晶片处理成几个640 / spl次/ 486格式的单片集成8-9和14-15 / splμ/ m两色(或双波长)QWIP焦平面阵列(FPA)。然后将这些FPA与640 / spl次/ 486硅CMOS读出多路复用器混合。将变薄的(即已去除基材的)FPA杂化物整合到液氦冷却的杜瓦瓶中,以进行电和光学表征,并演示同时进行的两色成像。 FPA中的8-9 / spl mu / m检测器显示了背景限制性能(BLIP),该条件在70 K的工作温度下,f / 2冷停的300 K背景下。在相同的背景条件下,FPA的14-15 / spl mu / m检测器在40 K的工作温度下达到BLIP。在本文中,我们从量子效率,探测性,噪声等效温差(NE / spl Delta / T),均匀性和可操作性方面讨论了这种长波长双频QWIP FPA的性能。

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