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String Current in Decananometer nand Flash Arrays: A Compact-Modeling Investigation

机译:十亿分之一nand闪存阵列中的串电流:紧凑模型研究

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This paper presents a detailed compact-modeling investigation of the string current in decananometer nand Flash arrays. This investigation allows, first of all, to highlight the role of velocity saturation, low-field mobility, and drain-induced barrier lowering on the string current versus read voltage characteristics. Results are validated on a 41-nm technology for different positions of the selected cell along the nand string, different pass voltages, and different array background patterns. The effect of cycling on the string current is then investigated by means of postcycling bake experiments, showing that the impact of charge trapping/detrapping and interface state generation/annealing varies as a function of the read current level. Compact-modeling results display that, at low read currents, charge trapping/detrapping represents the main damage mechanism for the cells, while interface states come into play for read currents close to the string saturation level via mobility degradation.
机译:本文提出了详细的紧凑模型研究,在癸烷计nand Flash阵列中的串电流。首先,这项研究可以强调速度饱和,低场迁移率以及漏极引起的势垒降低对串电流与读取电压特性的关系。结果在41纳米技术上针对沿着nand串的选定单元的不同位置,不同的通过电压和不同的阵列背景图案进行了验证。然后通过循环后烘烤实验研究了循环对串电流的影响,结果表明电荷俘获/去俘获和界面状态产生/退火的影响随读取电流水平的变化而变化。紧凑模型结果显示,在低读取电流下,电荷俘获/去俘获代表了电池的主要损坏机制,而界面状态由于迁移率降低而对接近于串饱和水平的读取电流起作用。

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