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Trigger and Self-Latch Mechanisms of n-p-n Bistable Resistor

机译:n-p-n双稳态电阻的触发和自锁机制

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Trigger and self-latch mechanisms in n-p-n bistable resistor (biristor) were investigated. A two terminal vertical n-p-n biristor with floating p-type base was fabricated on a bulk silicon wafer. The temperature and current compliance effects on the current-voltage characteristics were analyzed to understand the underlying physical mechanism. The fact that the current compliance is temperature independent suggests that latch-up is triggered by band-to-band tunneling. In contrast, the high temperature and current compliance diminished the latch-down and hysteresis loop, which reveals that impact ionization is responsible for self-latching at bistable regime.
机译:研究了n-p-n双稳态电阻器(双稳态电阻)中的触发和自锁机制。在块状硅晶片上制造了具有浮动p型基极的两端子垂直n-p-n双电阻器。分析了温度和电流顺从性对电流-电压特性的影响,以了解潜在的物理机制。电流顺从性与温度无关的事实表明,闩锁是由带间隧穿触发的。相反,高温和电流顺应性减小了闩锁和磁滞回线,这表明冲击电离是造成双稳态状态下自闩锁的原因。

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